Electron-Impact Ionization of Si5+

Experimental electron-impact single-ionization cross sections for Si⁵⁺. Relative uncertainties listed are two standard deviations. The absolute uncertainties at a 90% confidence level are listed in parentheses. Reference: J. S. Thompson and D. C. Gregory, Phys. Rev. A 50, 1377 (1994).

            Energy                 Cross Section
             (eV)                  (10^-18 cm²)

             196               0.010 ± 0.060 (0.060)
             208               0.093 ± 0.044 (0.044)
             220               0.510 ± 0.052 (0.063)
             231               0.841 ± 0.036 (0.070)
             243               1.108 ± 0.040 (0.088)
             268               1.483 ± 0.038 (0.112)
             293               1.816 ± 0.028 (0.131)
             317               2.042 ± 0.034 (0.148)
             341               2.288 ± 0.032 (0.165)
             365               2.421 ± 0.038 (0.175)
             390               2.566 ± 0.030 (0.184)
             415               2.687 ± 0.036 (0.193)
             440               2.804 ± 0.042 (0.202)
             463               2.861 ± 0.024 (0.204)
             487               2.95  ± 0.16 (0.26)
             573               3.136 ± 0.040 (0.225)
             588               3.03  ± 0.22 (0.31)
             635               3.136 ± 0.030 (0.224)
             683               3.121 ± 0.034 (0.223)
             733               3.069 ± 0.020 (0.218)
             783               3.036 ± 0.016 (0.215)
             831               3.068 ± 0.026 (0.218)
             887               2.879 ± 0.036 (0.207)
             936               2.870 ± 0.028 (0.205)
             987               2.804 ± 0.036 (0.202)
            1085               2.726 ± 0.036 (0.196)
            1185               2.69  ± 0.22 (0.291)
            1284               2.515 ± 0.030 (0.180)
            1382               2.56  ± 0.13 (0.22)
            1481               2.52  ± 0.10 (0.20)

Last Modified: Friday, January 10, 1997