Experimental electron-impact single-ionization cross sections for Si2+. The total relative uncertainties listed are at 90% confidence level. Total systematic uncertainties are estimated to be ±9%. Reference: N. Djuric et al., Phys. Rev. A 47, 4786 (1993).

            Energy           Cross Section
              (eV)            (10-18 cm2)

              25.6           0.002 ± 0.17
              28.2           0.22 ± 0.12
              30.4           0.28 ± 0.12
              32.1           0.29 ± 0.15
              33.1           0.42 ± 0.14
              34.0           0.45 ± 0.15
              38.0           1.08 ± 0.13
              47.7           1.75 ± 0.09
              57.8           1.81 ± 0.11
              67.7           1.89 ± 0.08
              77.5           1.94 ± 0.07
              87.2           1.97 ± 0.06
              97.1           1.85 ± 0.05
             106.9           1.82 ± 0.05
             116.6           1.94 ± 0.06
             118.0           2.16 ± 0.07
             126.4           1.98 ± 0.05
             137.8           2.07 ± 0.07
             146.0           1.89 ± 0.06
             157.4           1.92 ± 0.06
             170.2           1.87 ± 0.05
             177.2           1.88 ± 0.05
             195.8           1.75 ± 0.04
             245.6           1.67 ± 0.04
             296.1           1.51 ± 0.03
             346.7           1.36 ± 0.03
             395.2           1.26 ± 0.03
             446.8           1.20 ± 0.03
             494.5           1.18 ± 0.03
             594.8           1.07 ± 0.02
             693.5           0.96 ± 0.02
             723.0           0.92 ± 0.02
             893.6           0.91 ± 0.02
             992.6           0.89 ± 0.02

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Last Modified: Friday, January 10, 1997