Experimental electron-impact single-ionization cross sections for Si+. The total relative uncertainties listed are at 90% confidence level. Total systematic uncertainties are estimated to be ±9%. Also included are data using Si+ formed by charge exchange of Si2+; this eliminated N2+ impurity ions in the beam. Reference: N. Djuric et al., Phys. Rev. A 47, 4786 (1993).

            Energy        Cross Section
             (eV)          (10-18 cm2)

              16.3         1.22 ± 0.39
              16.4         1.00 ± 0.32
              16.6         1.55 ± 0.19
              16.9         2.05 ± 0.19
              17.1         3.09 ± 0.21
              17.4         3.98 ± 0.19
              17.6         4.23 ± 0.19
              17.9         4.96 ± 0.20
              18.1         5.30 ± 0.20
              18.4         5.62 ± 0.20
              18.6         5.87 ± 0.28
              18.9         6.26 ± 0.27
              19.1         7.39 ± 0.31
              19.3         8.21 ± 0.30
              19.6         8.33 ± 0.30
              19.8         9.90 ± 0.31
              20.1        10.2  ± 0.3
              20.3        11.3  ± 0.3
              20.7        11.8  ± 0.4
              21.0        12.1  ± 0.4
              21.4        12.9  ± 0.4
              21.7        13.1  ± 0.4
              22.1        13.2  ± 0.4
              22.4        13.4  ± 0.4
              22.8        13.4  ± 0.4
              23.1        13.5  ± 0.4
              23.4        13.7  ± 0.3
              23.7        14.4  ± 0.4
              23.9        14.5  ± 0.4
              24.2        14.1  ± 0.3
              24.5        15.1  ± 0.4
              24.8        14.5  ± 0.4
              25.2        14.5  ± 0.4
              25.4        15.0  ± 0.4
              25.7        14.7  ± 0.4
              25.9        14.7  ± 0.4
              26.2        15.3  ± 0.4
              26.6        15.2  ± 0.4
              26.9        15.3  ± 0.4
              27.1        15.7  ± 0.4
              27.4        15.4  ± 0.4
              27.6        15.6  ± 0.4
              27.9        15.4  ± 0.4
              28.3        15.5  ± 0.4
              28.7        15.2  ± 0.4
              29.1        15.0  ± 0.4
              29.4        15.0  ± 0.4
              29.8        15.3  ± 0.4
              33.2        16.1  ± 0.5
              38.2        16.3  ± 0.4
              43.1        15.3  ± 0.4
              57.7        14.2  ± 0.3
              67.4        13.5  ± 0.3
              77.1        12.8  ± 0.3
              87.2        11.9  ± 0.3
              96.9        11.2  ± 0.2
             117.1        10.7  ± 0.2
             137.0         9.77 ± 0.22
             156.8         8.78 ± 0.21
             176.9         8.22 ± 0.20
             196.0         7.75 ± 0.17
             246.2         6.77 ± 0.15
             295.6         5.98 ± 0.14
             344.2         5.51 ± 0.12
             393.2         5.01 ± 0.11
             492.1         4.13 ± 0.09
             492.4         4.30 ± 0.09
             591.3         3.75 ± 0.08
             689.5         3.25 ± 0.07
             788.8         2.89 ± 0.06
             887.7         2.72 ± 0.06
             987.5         2.67 ± 0.06
Si+ from charge transfer:
              38.1        17.6  ± 1.1
              98.3        12.3  ± 0.6
             245.5         7.23 ± 0.30
             491.8         4.27 ± 0.12

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Last Modified: Friday, January 10, 1997