The user port is available for collaborative research with outside users. For more information regarding physical footprint of user port, facility capabilities, port availability, etc., please contact Dr. F. W. Meyer. Detailed information about available multicharged ion beams can be found in ECR Source page
MIRF HOME |
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ECR SOURCE |
ION ION EXP |
ION SURFACE EXP
ELECTRON-ION CROSSED BEAM EXP
ION-AT0M MERGED BEAM EXP
ELECTRON-ION MERGED EXP |
CFADC
Last modified by Frank Yan on April 23 1996
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